FIELD: atomic-emission spectrum analysis. SUBSTANCE: the method consists in radiant excitation of sample in a low-temperature plasma, photographic recording of the emission spectrum of the sample is carried out, blackenings of the basic line of element S and comparison line Scomp are measured, and the content of unknown element Cx is calculated by a set of simultaneous equations. EFFECT: enhanced accuracy and truth of determination of fractions of total mass of elements in materials and alloys, expanded field of practical application of the emission spectrum analysis due to exclusion of the standard specimens from the process of execution of current analyses. 2 cl
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