DIFFRACTOMETER AND METHOD OF DIFFRACTION ANALYSIS Russian patent published in 2008 - IPC G01N23/20 G01N23/207 

Abstract RU 2314517 C2

FIELD: roentgenoscopy.

SUBSTANCE: diffractometer comprises base, analytic instrument, source of radiation beam, radiation beam detector, means for moving the analytic instrument in space, cantilever for supporting the analytic instrument that is mounted for permitting rotation, means for rotation of the source and detector around the center of the diffractometer so that the axes of the beams of the source and detector of radiation lie in the equatorial plane, and structure for moving the analytic instrument.

EFFECT: enhanced precision.

15 cl, 5 dwg

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RU 2 314 517 C2

Authors

Berti Dzhovanni

Dates

2008-01-10Published

2003-01-21Filed