FIELD: roentgenoscopy.
SUBSTANCE: diffractometer comprises base, analytic instrument, source of radiation beam, radiation beam detector, means for moving the analytic instrument in space, cantilever for supporting the analytic instrument that is mounted for permitting rotation, means for rotation of the source and detector around the center of the diffractometer so that the axes of the beams of the source and detector of radiation lie in the equatorial plane, and structure for moving the analytic instrument.
EFFECT: enhanced precision.
15 cl, 5 dwg
Title | Year | Author | Number |
---|---|---|---|
DEVICE FOR EXTERNAL X-RAY INSPECTION OF WELDED SEAMS OF CYLINDRICAL PRODUCTS | 2021 |
|
RU2755397C1 |
ADJUSTABLE DEVICE FOR IRRADIATION AND DETECTING RADIATION | 2006 |
|
RU2403560C2 |
X-RAY DIFFRACTOMETER | 0 |
|
SU1599733A1 |
METHOD OF ADJUSTING SAMPLES IN X-RAY DIFFRACTOMETER | 2016 |
|
RU2617560C1 |
X-RAY REFLECTOMETER | 1999 |
|
RU2166184C2 |
MONOCRYSTAL ORIENTING CUTTING UNIT | 0 |
|
SU1766685A1 |
PROCESS OF ADJUSTMENT OF DIFFRACTOMETER | 1992 |
|
RU2114420C1 |
X-RAY DIFFRACTION METER | 2017 |
|
RU2664774C1 |
X-RAY DIFFRACTOMETER | 0 |
|
SU1627942A1 |
DIFFRACTOMETER PRIMARY BEAM ADJUSTING METHOD | 0 |
|
SU1041918A1 |
Authors
Dates
2008-01-10—Published
2003-01-21—Filed