DIAGNOSTICS OF TECHNOLOGICAL DEVICE WITH APPLICATION OF PROCESS PARAMETER SENSOR SIGNAL Russian patent published in 2008 - IPC G05B23/02 

Abstract RU 2325685 C2

FIELD: technological processes.

SUBSTANCE: present invention is related to diagnostics of technological devices for application in industrial technological processes. This is achieved by using diagnostic device in automated system of technological process control, which receives signal of sensor (146) that characterizes process parameter (132) of the process, which is perceived by process parameter sensor. Front-end processor (150) of signal forms output signal of sensor capacity as function of frequency distribution of sensor signal power. Process condition is determined on the basis of sensor capacity signal.

EFFECT: improves diagnostics technology.

32 cl, 10 dwg

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RU 2 325 685 C2

Authors

Ehriurek Ehvren

Kavaklioglu Kadir

Ehsboldt Stiven R.

Dates

2008-05-27Published

2004-06-03Filed