CALIBRATION STAND FOR X-RAY THICKNESS GAUGE Russian patent published in 2008 - IPC G01B15/02 

FIELD: physics.

SUBSTANCE: invention concerns control and test devices for x-ray thickness gauges for nondestructive ferrous and nonferrous sheet products control. Calibration stand for x-ray thickness gauge includes a platform with a hole, x-ray emitter and receiver on the opposite ends of the platform, a processor and a detector, a disc with rotation actuator between the platform and the receiver, and removable sample kit of various materials with different standard thickness. Holes for fixing of samples are made at regular pace in circular cross cut of radius R of the disk, while one hole does not hold a sample. Besides, the stand features shutter of x-ray-absorbing material, linear actuator for the shutter, two parallel rails for articulated mounting of the shutter on the platform, disc fixation unit, switch flag and gap probe. At that, the shutter is kinematically connected to linear actuator, while the rails are set symmetrically on the opposite sides of platform hole axis at a distance not less than platform hole diameter, so that the shutter can screen the platform hole when moving by the rails. Gap probe is installed on the platform under the disk face profile and is directed so that its gap is screened by the free end of rotating flag. Gap of the probe is connected to the processor input, while the second and the third processor inputs are connected to the disc rotation actuator and the shutter linear actuator respectively.

EFFECT: stand can be easily transported to any stationary control and test position of rolling mill.

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