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Application

2002106446/28, 2002-03-14

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Start date

2002-03-14

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Actual filing date

2002-03-14

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Published

2003-10-27

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Inventor

Maslov A.I.Zapuskalov V.G.Vladimirov L.V.Gusev E.A.Artem'Ev B.V.Volchkov Ju.E.Bojarintsev D.S.Ivanov D.P.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Nauchno-Issledovatel'Skij Institut Introskopii Moskovskogo Nauchno-Proizvodstvennogo Ob"Edinenija

X-RAY THICKNESS GAUGE Russian patent published in 2003 - IPC

Abstract RU 2215260 C1

FIELD: X-ray measurement technology. SUBSTANCE: X-ray thickness gauge has three ionization chamber in the capacity of radiation detectors. Peculiarity of this meter lies in availability of third chamber, unit controlling anode voltage of radiator and unit controlling anode current of radiator. Value of effective atomic number of third chamber is greater ( or less ) than value of effective atomic number of second chamber. EFFECT: stabilized measurement precision of thickness of rolled stock in dynamics in full range of permitted time of utilization of thickness gauge. 1 cl, 5 dwg

Similar patents RU2215260C1

Title	Year	Author	Number
X-RAY TYPE THICKNESS GAGE	2001	Maslov A.I. Zapuskalov V.G. Egorov I.V. Artem'Ev B.V. Volchkov Ju.E.	RU2210059C1
X-RAY THICKNESS GAUGE	2001	Maslov A.I. Artem'Ev B.V. Zapuskalov V.G. Egorov I.V. Rolik V.A. Volchkov Ju.E. Vedernikov B.G.	RU2215991C2
X-RAY METER OF PARAMETERS OF ROLLED STOCK OUT OF METALLIC ALLOY	2004	Maslov A.I. Artem'Ev B.V. Zapuskalov V.G. Volchkov Ju.E. Gusev V.E.	RU2257543C1
BED TESTING CHARACTERISTICS OF X-RAY THICKNESS GAUGES	2002	Maslov A.I. Zapuskalov V.G. Doncheev M.N. Ivanov D.P. Artem'Ev B.V. Volchkov Ju.E. Bojarintsev D.S.	RU2215259C2
X-RAY THICKNESS GAUGE FOR ROLLED METAL PRODUCTS	2007	Maslov Aleksandr Ivanovich Zapuskalov Valerij Grigor'Evich Artem'Ev Boris Viktorovich	RU2330240C1
PORTABLE DEVICE OF AUTOMATED DIAGNOSTICS OF X-RAY THICKNESS GAUGES	2002	Zapuskalov V.G. Maslov A.I. Artem'Ev B.V. Volchkov Ju.E. Bosamykin V.A. Bojarintsev D.S.	RU2219492C1
DEVICE FOR X-RAY INSPECTION OF THICKNESS OF SHEET ITEMS	2004	Maslov A.I. Zapuskalov V.G. Artem'Ev B.V. Volchkov Ju.E. Gusev V.E.	RU2259538C1
CALIBRATION STAND FOR X-RAY THICKNESS GAUGE	2006	Maslov Aleksandr Ivanovich Zapuskalov Valerij Grigor'Evich Artem'Ev Boris Viktorovich Sozontov Aleksandr Aleksandrovich	RU2327953C1
RADIOPARENT IONIZATION CHAMBER	2001	Maslov A.I. Zapuskalov V.G. Vladimirov L.V. Artem'Ev B.V. Mishkinis B.Ja. Volchkov Ju.E.	RU2194332C1
SHEET ARTICLES THICKNESS X-RAY MEASUREMENT METHOD	2002	Maslov A.I. Zapuskalov V.G. Vladimirov L.V. Gusev V.E. Artem'Ev B.V. Volchkov Ju.E. Bojarintsev D.S. Vedernikov M.B.	RU2234677C2

RU 2 215 260 C1

Authors

Maslov A.I.

Zapuskalov V.G.

Vladimirov L.V.

Gusev E.A.

Artem'Ev B.V.

Volchkov Ju.E.

Bojarintsev D.S.

Ivanov D.P.

Dates

2003-10-27—Published

2002-03-14—Filed