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2 215 259

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IPC

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Application

2002100144/28, 2002-01-10

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Start date

2002-01-10

(22)

Actual filing date

2002-01-10

(45)

Published

2003-10-27

(72)

Inventor

Maslov A.I.Zapuskalov V.G.Doncheev M.N.Ivanov D.P.Artem'Ev B.V.Volchkov Ju.E.Bojarintsev D.S.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Nauchno-Issledovatel'Skij Institut Introskopii Moskovskogo Nauchno-Proizvodstvennogo Ob"Edinenija

BED TESTING CHARACTERISTICS OF X-RAY THICKNESS GAUGES Russian patent published in 2003 - IPC

Abstract RU 2215259 C2

FIELD: X-ray measurement technology. SUBSTANCE: bed is equipped with second disc with rotation drive and set of separable specimens of working thicknesses and separable supplementary specimens of standard thicknesses. Windows with radius r similar to windows in first disc are made in second disc in circumferential cross-section in which separable specimens of working thicknesses and/or separable supplementary specimens of standard thicknesses are installed. Second disc is positioned between first disc and radiation detector and is displaced with its axis from axis of X-radiation by value r and first disc is added in circumferential cross-section of radius r with two windows. One window is open to X-radiation and the other is closed to it. EFFECT: provision for high metrological indices of thickness gauge, wide range of tested thicknesses and X-ray safety while thickness gauge is adjusted. 1 dwg

Similar patents RU2215259C2

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RU 2 215 259 C2

Authors

Maslov A.I.

Zapuskalov V.G.

Doncheev M.N.

Ivanov D.P.

Artem'Ev B.V.

Volchkov Ju.E.

Bojarintsev D.S.

Dates

2003-10-27—Published

2002-01-10—Filed