RESEARCH OF NANOSCOPIC FLAWS IN MATERIAL STRUCTURE Russian patent published in 2008 - IPC G01N23/20 

FIELD: physics.

SUBSTANCE: dry material sample under investigation is exposed to neutron cluster, and small-angle scattering intensity distribution is measured. For measurement of small-angle scattering intensity distribution for a sample with given mass a neutron cluster with wide wave length range is used. The dry material sample is additionally dipped into light and heavy water mixture with such heavy water concentration, that surface scattering contrast of the sample particles is eliminated, and small-angle neutron scattering for the given conditions is measured. It provides information on internal nanoscopic material flaws of the sample, and the difference of small-angle scattering intensity for dry material and material soaked in the light and heavy water mix defines the share of external nanoscopic flaws. At that, these small-angle scattering intensity values are rated by the value for a standard 1 mm thick water sample of given section at the temperature of 20°C. Next the sections (dσ/d Ω) of internal and external nanoscopic flaws are obtained in absolute units for a gram of substance, and then the areas of internal and external flaws are calculated separately by Porod function.

EFFECT: enables defining of external and internal flaw area in the structure of dispersed material under investigation.

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