METHOD FOR MEASURING REFLECTION FACTOR ACCORDING TO RADAR ABSORBENT MATERIAL POWER IN ULTRA-WIDE FREQUENCY BAND Russian patent published in 2009 - IPC G01R27/06 G01S13/00 

FIELD: physics; measurement.

SUBSTANCE: method for measuring power reflection factor of radar absorbent material (RAM) in ultra-wide frequency band relates to radiolocation and may be used to measure power reflection factor K_RAM(θ_"ц") for fixed frequencies in ultra-wide band at different angles of incidence of electromagnetic wave. The method implies irradiating two metal plates of similar size, one RAM-coated and another without RAM coating, with ultra-wideband signals in free space, receiving of reflected signal and calculating RAM reflection factor. For each angle of incidence of electromagnetic wave, specularly reflected component, which corresponds to reflected energy maximum, is extracted for each reflected signal. These components are approximated with real parts of specially selected complex wavelets. Energy spectra of wavelet transformation for real parts of approximating wavelets are calculated. On respective energy wavelet spectrograms, scale and offset values corresponding to spectral density maxima are determined and parameters of complex wavelet real parts correlating therewith are found. Local energy frequency spectra of specularly reflected components of signals reflected from RAM-coated plate and from non-coated metal plate are calculated. RAM power reflection factor in ultra-wide frequency band is determined. The said method provides for significant increase in accuracy of RAM power reflection factor measurement in ultra-wide frequency band due to elimination of difractive component contribution in K_RAM(θ_"ц") determination.

EFFECT: increased accuracy of RAM power reflection factor measurement in ultra-wide frequency band due to elimination of difractive component contribution in K_RAM(θ_"ц") determination.

12 dwg