METHOD OF MEASURING LOCAL EFFECTIVE REFLECTIVE SURFACES OF OBJECTS IN ULTRA WIDE FREQUENCY Russian patent published in 2009 - IPC G01S7/41 

FIELD: radar-location.

SUBSTANCE: proposed method of measuring local effective reflective surfaces of objects relates to radar-location. The method is based on irradiating radar-location objects in free space with a series of ultra-short pulses. The measured time dependence of the probe signal in the point of irradiation of the object at a distance R from antennae is approximated using a wavelet and numerical values of its parametres w and z are found. Through Fourier transform of the measured time dependence of the probe signal, the energy frequency spectrum (EFS) of the probing field is determined. The time signal reflected from the object is then recorded, and based on the found approximate wavelet energy wavelet-spectra of coefficients of wavelet-transformation of the reflected signal are calculated. On the wavelet spectrogram of the energy spectrum in coordinates of scale and shift parametres, the values of scale and shift parametres of the corresponding maximum reflected energy are calculated, arising from the j-th local scattering centre - "bright point". The local energy spectrum of coefficients of wavelet-transformation is calculated. Frequency is determined as the average wavelet frequency with parametres w and z and scale and shift parametres of the analysed "bright point". The frequency range of the analysed local energy frequency spectrum is determined and the local energy frequency spectrum of the j-th "bright point" is determined. From the measurements carried out, the local effective reflective surface of the analysed local scattering centre of the object is determined.

EFFECT: fast determination of local effective reflective surfaces of radar-location objects with increased accuracy due to time localisation of spectral components of the reflected signal.

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