POSITIONING DEVICE WITH SAMPLE THERMAL DRIFT COMPENSATION IN SYSTEM WITH ION OR ELECTRON SOURCE Russian patent published in 2010 - IPC H01L41/09 B81B7/02 G01Q10/04 

Abstract RU 2388116 C1

FIELD: physics.

SUBSTANCE: invention relates to devices for precise sample positioning in ultrahigh vacuum using piezoelectric engines and a system of capacitive sensors in focused ion or electron beam installations in which nanoelements are formed. The sample is positioned relative an ion gun not using not only coarse ultrasonic engines but by moving an additional platform with piezoelectric engines into the sample positioning system whose position is tracked with precise capacitive sensors. There is compensation for thermal drift of the coordinate positioning system and nonlinearity of movement of the piezoelectric engines by processing signals from the capacitive sensors in the positioning system and feedback with the piezoelectric engines. There is tacking and compensation for deviation of the ion gun as a result of thermal warping of the vacuum chamber through additional movement of the piezoelectric engines as a result of processing signals from the capacitive sensors which keep track of the position of the flange on which the ion gun is mounted relative the base of the positioning system which is attached to the bottom flange of the chamber. The position of the positioning system in the ultrahigh vacuum chamber is monitored using an interferometric system outside the camber through viewing window.

EFFECT: increased accuracy of making the required theoretically calculated nanoelectronic elements with good reproducibility.

3 cl, 3 dwg, 1 ex

Similar patents RU2388116C1

Title Year Author Number
WALKING ROBOT-NANOPOSITIONER AND METHOD OF CONTROLLING MOVEMENT THEREOF 2010
  • Lapshin Rostislav Vladimirovich
RU2540283C2
PROCEDURE OF MOVEMENT OF SONDE OF SCANNING MICROSCOPENANOLITHOGRAPH IN FIELD OF COARSE X-Y POSITIONER 1999
  • Lapshin R.V.
RU2181212C2
SCANNING TUNNEL MICROSCOPE 2005
  • Lipanov Aleksej Matveevich
  • Shelkovnikov Evgenij Jur'Evich
  • Tjurikov Aleksandr Vasil'Evich
  • Guljaev Pavel Valentinovich
  • Gudtsov Denis Vjacheslavovich
RU2296387C1
METHOD FOR MEASURING SURFACE RELIEF BY MEANS OF SCANNING PROBE TYPE MICROSCOPE 1999
  • Lapshin R.V.
RU2175761C2
NANOMETER-RANGE POSITIONING DEVICE 2002
  • Rakhovskij V.I.
RU2233736C2
SCANNING PROBING MICROSCOPE, COMBINED WITH DEVICE FOR MODIFYING SURFACE OF OBJECT 2005
  • Martin Mjuller
  • Matsko Nadezhda Borisovna
  • Efimov Anton Evgen'Evich
  • Saunin Sergej Alekseevich
  • Sokolov Dmitrij Jur'Evich
RU2282257C1
METHOD OF FORMING OBJECTS ON SURFACE OF MATERIALS USING FOCUSED ION BEAM 2011
  • Pustovalov Evgenij Vladislavovich
  • Plotnikov Vladimir Sergeevich
  • Grudin Boris Nikolaevich
  • Glukhov Aleksej Petrovich
  • Kirillov Aleksej Valer'Evich
RU2457573C1
GEAR TESTING MIRRORS 1981
  • Ikrjannikov N.P.
  • Chernenko V.M.
  • Narusbek Eh.A.
  • Alekseev V.A.
  • Egorov V.N.
  • Bilibin S.V.
  • Bagdasarov Z.E.
  • Vasil'Ev L.A.
  • Antsiferov V.N.
  • Zejgarnik Ju.A.
RU2090965C1
DEVICE FOR VACUUM APPLICATION OF HARDENING COATING ON SURFACE OF ARTICLES 2023
  • Tarbokov Vladislav Aleksandrovich
  • Stepanov Andrei Vladimirovich
  • Pavlov Sergei Konstantinovich
  • Smolianskii Egor Aleksandrovich
  • Remnev Gennadii Efimovich
RU2816980C1
TEMPERATURE-COMPENSATED SCANNER 1999
  • Bykov V.A.
  • Medvedev B.K.
  • Sokolov D.Ju.
RU2169401C2

RU 2 388 116 C1

Authors

Nevolin Vladimir Kirillovich

Tsarik Konstantin Anatol'Evich

Dates

2010-04-27Published

2008-10-23Filed