FIELD: electricity.
SUBSTANCE: in a method for controlling batch manufacturing processes of resistive components of integrated circuits, the process correction of design operational variables of the resistive components is paced with considering contact resistance deviation in an interface of a resistive layer and contact pads of the resistive components by a value correlative to a production error of electric resistances of film resistors of test structures, therefore the latter are made of two pairs of the film resistors, and each pair contains the coupled film resistors of equal width and different length connected on the ends with the contact pads of width equal to that of the pair of the film resistors of a test structure.
EFFECT: more effective control of batch manufacturing processes of the resistive components of the integrated circuits.
4 cl, 3 dwg
Title | Year | Author | Number |
---|---|---|---|
TESTING STRUCTURE FOR DETERMINATION OF FILM RESISTOR SPECIFIC RESISTANCE | 0 |
|
SU1084701A1 |
MANUFACTURING METHOD FOR THIN-FILM RESISTORS | 2007 |
|
RU2332741C1 |
METHOD OF PRODUCING FILM RESISTORS OF PRINTED CIRCUIT BOARDS | 0 |
|
SU961169A1 |
TEST PLATE FOR MEASURING VALUE OF EVAPORATED RESISTORS | 1988 |
|
SU1686961A1 |
METHOD OF KRYUCHATOV HYBRID CHIP CARDS PRODUCTION | 2007 |
|
RU2342812C2 |
METHOD FOR PRODUCING THIN-FILM PLATINUM THERMISTORS ON A DIELECTRIC SUBSTRATE AND A THERMISTOR DEVICE (OPTIONS) | 2022 |
|
RU2791082C1 |
METHOD OF REJECTING POTENTIALLY UNRELIABLE THIN-FILM RESISTORS | 2023 |
|
RU2825537C1 |
MANUFACTURING METHOD FOR FILM RESISTORS | 2007 |
|
RU2339104C1 |
MATERIAL FOR PRODUCTION OF THIN-FILM RESISTORS | 2007 |
|
RU2340971C1 |
METHOD OF MANUFACTURING PRECISION THIN-FILM RESISTORS | 0 |
|
SU1812561A1 |
Authors
Dates
2010-11-10—Published
2009-08-17—Filed