FIELD: process engineering.
SUBSTANCE: invention relates to gas analysis and can be used for testing gas analysers (drift spectrometers, gas chromatographs, etc) to calibrate them, determine registration thresholds and dynamic ranges, and for comparative tests of diverse gas analysers and detectors. Proposed method comprises applying reference substance onto carrier developed surface and gas sampling from gas volume above carrier surface. Note here that reference substance is dissolved to known concentration in solvent with low vapour pressure. Then, obtained solution is diluted by solvent with high vapour pressure and applied onto carrier surface. High vapour pressure solvent removed, gas sampling is performed at the rate that allows maintaining equilibrium distribution of reference substance between gas phase above carrier surface and reference substance applied thereon. Note here that low vapour pressure solvent represents PPE, while high vapour pressure solvent represents acetone and ethyl oxide.
EFFECT: expanded range of concentrations and reduced gas dynamic resistance.
5 cl, 1 dwg, 1 tbl, 2 ex
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Authors
Dates
2011-01-27—Published
2009-10-07—Filed