METHOD OF ANALYSING POWER SPECTRUM OF ELECTRONIC STATES AND DEVICE TO THIS END Russian patent published in 2011 - IPC G01J3/00 B82B3/00 

FIELD: physics.

SUBSTANCE: proposed method consists in determining temperature of relaxation of electrophysical magnitudes, e.g. current passing through the specimen at external effects, detecting controlled object by scanning in probe microscope, e.g. atomic powered microscope, and forming barrier contact with analysed object by probe. Proposed device comprises square pulse generator connected to deep-level relaxation spectroscopy device connected to probe microscope, e.g. atomic powered microscope, to vary controlled object temperature.

EFFECT: possibility of local analysis of power spectrum of electronic states in nanostructures.

2 cl, 1 dwg