FIELD: electricity.
SUBSTANCE: in nanoelectronic semiconductor rectifying diode made of two contact areas produced from alloyed GaAs with concentration of Si 1×1018…1×1019 1/cm3, spacers made of GaAs, and heterostructure including three alternating areas: potential barriers made of AlyGa1-yAs, where y - molar share Al, with thickness from 1.70 to 8.48 nm with molar share Al from 0.4 and 1 and potential pit arranged between them with thickness of 7.91…12.44 nm, made of GaAs, ratio of thicknesses of layers of potential barriers is within the limits of 1.3…5 at appropriate ratio of molar shares Al, within the limits of 1.6…2.5.
EFFECT: development of a rectifying diode with shape BAX, making it possible to increase rectifier output voltage.
3 dwg
Title | Year | Author | Number |
---|---|---|---|
NANOELECTRONIC SEMICONDUCTOR RECTIFIER DIODE | 2010 |
|
RU2412898C1 |
NANOELECTRONIC SEMICONDUCTOR RECTIFIER DIODE | 2010 |
|
RU2412897C1 |
NANOELECTRONIC SEMICONDUCTOR MIXER DIODE | 2008 |
|
RU2372694C1 |
NANOELECTRONIC SEMICONDUCTOR MIXER DIODE | 2008 |
|
RU2372691C1 |
NANOELECTRONIC SEMICONDUCTOR MIXER DIODE | 2008 |
|
RU2372692C1 |
NANOELECTRONIC SEMICONDUCTOR MIXER DIODE | 2008 |
|
RU2372693C1 |
METHOD OF DETERMINING RESISTANCE TO RADIATION AND TEMPERATURE EFFECTS OF NANOELECTRONIC RESONANT-TUNNELING DIODE (RTD) BASED ON MULTILAYER ALGAAS (ALUMINIUM, GALLIUM, ARSENICUM) SEMICONDUCTOR HETEROSTRUCTURES | 2015 |
|
RU2606174C1 |
CONVERTER OF UHF-RANGE ELECTROMAGNETIC WAVE ENERGY INTO CONTINUOUS VOLTAGE | 2010 |
|
RU2443050C1 |
VERTICAL-EMITTING LASER WITH INTRACAVITY CONTACTS AND DIELECTRIC MIRROR | 2016 |
|
RU2704214C1 |
SEMICONDUCTOR VERTICALLY-EMITTING LASER WITH INTRACAVITY CONTACTS | 2015 |
|
RU2611555C1 |
Authors
Dates
2011-03-27—Published
2010-02-16—Filed