METHOD OF COHERENT X-RAY PHASE MICROSCOPY Russian patent published in 2011 - IPC G01N23/20 

FIELD: physics.

SUBSTANCE: solid object is irradiated by spatially coherent X-ray beam to detect diffraction 2D crosswise radiation intensity is far zone foe every discrete spatial position of object relative to sounding beam, 3D image is reconstructed by computer at spontaneous characteristics single-wave radiation to define mean contrast of 2D crosswise radiation spectrum field for every spatial position, coherence time τ_c of sounding radiation is decreased or radiation spectral line width Δv_c is increased on changing from characteristic X-ray radiation to continuous decelerating X-ray radiation to magnitude corresponding to two-fold decrease in radiation spectrum filed contrast to define local phase lag τ_ph from relation τ_ph=τ_c=1/Δv_c measured for every angle of object rotation so that 3D distribution of electron density and refractivity are reconstructed.

EFFECT: noninvasive measurement of 3D micro- and nano object images in using traditional X-ray tubes.

2 cl, 2 dwg