FIELD: process engineering.
SUBSTANCE: invention relates to metal and semiconductor forming. Proposed method comprises metal forming with application of pulsed electric field for plastification and reduction of material strain resistance. Note here that short pulses of electric field are applied to billet. Pulse duration approximates to dielectric Maxwell relaxation interval defined by relation Θm=ε0ερ/4π, where ε0 is dielectric coefficient of vacuum equal to 8.85418×10-14 (S.s/Vcm), ε is relative dielectric factor of material, ρ is material specific resistance, (Ohm cm), while field intensity varies from tens to hundreds of V/cm. This causes polarisation of dislocations in surface near-surface layers of processed material and their orientation along electric field lines.
EFFECT: electric plastification, reduced resistance of material and power savings.
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Authors
Dates
2011-10-27—Published
2009-09-08—Filed