METHOD OF LOCALIZATION OF SHORT-CIRCUIT FAULTS OF OUTPUTS OF MICROCIRCUIT CHIPS JTAG BY INTERFACE AND DEVICE FOR ITS IMPLEMENTATION Russian patent published in 2019 - IPC G01R31/28 

FIELD: electronic equipment.

SUBSTANCE: invention relates to production and diagnostics of highly integrated electronic modules in aircraft and space industry. Proposed device comprises personal computer with software connected via JTAG controller to JTAG interface of tested electronic module and contactless current sensor in the form of magnetic field converter to electric signal connected to inputs of non-inverting and inverting amplifiers. Output of the non-inverting amplifier through the first diode and the output of the inverting amplifier through the second diode are connected to the load resistance, to the input of the electronic switch and to the second input of the voltage comparator. Output of the electronic switch is connected to the analogue memory input, the output of which is connected to the resistive voltage divider by the middle point connected to the first input of the voltage comparator. Electronic switch control inputs, sampling and storage circuits, voltage comparator output and device activation button are connected to the appropriate JTAG cells of the microcircuit. JTAG interface of the microcircuit chip is connected to the JTAG interface of the entire device.

EFFECT: localization of short-circuit faults between outputs of JTAG chips connected in parallel to the information bus, high reliability of results of the localization process and its complete automation.

5 cl, 6 dwg, 4 tbl