FIELD: physics.
SUBSTANCE: device is tested, for which the initial R1 and final R0 value of the test parameter and the mean time to failure Tan is known. The device is tested for a given testing period with overall duration T0, which is at least an order less than the mean time to failure Tan of the device. The value of the test parameter Rmeas(T0) is measured when the given overall duration of testing is achieved and then compared with the limit value Rlim(T0) of the test parameter calculated using the expression: 
EFFECT: method considerably cuts the duration of testing a device while simultaneously increasing the accuracy of the data on its reliability.
2 dwg
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