METHOD OF DETERMINING THICKNESS OF THIN TRANSPARENT FILM Russian patent published in 2012 - IPC G01B11/06 G01N21/21 

Abstract RU 2463554 C1

FIELD: physics.

SUBSTANCE: method involves measuring ellipsometric parameters Δ and Ψ and then recording the measurement results in a plane in form of a curve, wherein ellipsometric parameters Δ and Ψ of a metal powder pressed in advance are determined, the measurement results of which are recorded on a plane in which there are curves, having the recorded measurement results of the ellipsometric parameters Δ and Ψ of the powder of the corresponding metal which is pressed in advance, with predetermined optical parameters, obtained using several values of given optical parameters of said powder, set by varying the volume ratio of the active metal with a certain increment.

EFFECT: invention enables to determine an oxide film formed on the surface of a metal powder, as well as volume ratio of the active metal.

4 dwg

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RU 2 463 554 C1

Authors

Akashev Lev Aleksandrovich

Shevchenko Vladimir Grigor'Evich

Kochedykov Viktor Anatol'Evich

Popov Nikolaj Aleksandrovich

Dates

2012-10-10Published

2011-05-10Filed