FIELD: measurement equipment.
SUBSTANCE: invention can be used in registration of fast processes. According to the method, during interaction of a surveyed process and a sensor that damages in contact with a surveyed process, a sensor is lit with an external source of light, and photoregistration is carried out on the light reflected from the surface of the contact sensor with the help of a CCD matrix. A value of an electric charge is measured, accumulated during the time of CCD matrix exposure. According to the value of the electric charge, the moments of sensor sections are defined, and using the difference of charge values in different pixels of the CCD matrix, an interval of time is determined between the moments of process interaction with sensor sections. The device comprises a contact sensor, an external source of light and a CCD matrix installed in a plane of a contact sensor image. The part of the sensor is arranged in the form of a contact surface that reflects light from a source. The source of light is equipped with an optical modulator and/or a CCD matrix is equipped with an optical gate, which determines duration of CCD matrix exposure.
EFFECT: increased accuracy of measurements of time intervals, increase spatial resolution of surveyed processes measurements, increased number of channels of parallel measurements of time intervals, technical simplification and expansion of experimental capabilities of application.
13 cl, 18 dwg
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Authors
Dates
2012-11-20—Published
2011-02-25—Filed