FIELD: instrument making.
SUBSTANCE: source of ions for a mass spectrometer according to the first version comprises a chamber (1), in the first end (2) of the chamber (1) there is a hole (3), in which a device (4) of sample electric sputtering is located. In the side wall (5) of the chamber (1) near the first end (2) there is at least one pipe (7) installed along the tangent to the side wall (5), for supply of heated compressed gas into the chamber (1). In the second end (9) of the chamber (1) there is the first electrode (11) with a central hole (12) for release of ions surrounded by the second electrode (13) with a hole (14) in the central area, formed with the first electrode (9) an electrostatic focusing lens for ions (15). In the side wall (5) of the chamber (1) there is at least one hole (13) for release of gas and non-evaporated drops of the sample, distant from the second end (8) by the distance d, which meets a certain ratio. According to the second version a hole (44), in which the device (4) is located for electric sputtering of the sample, is made in the side wall (43) of the chamber (40), and in the first end (41) of the chamber (40) there is a hole (42) for gas release.
EFFECT: increased share of charged particles, mostly ions arriving from a source of ions to an inlet of a mass spectrometer.
20 cl, 10 dwg
