METHOD OF MEASURING EMISSIVITY FACTOR Russian patent published in 2014 - IPC G01J5/12 

FIELD: physics.

SUBSTANCE: method involves successive measurement of temperature of a reference sample and an analysed sample made of the same material. The reference and analysed samples are in form of two plates with the same coating, placed opposite each other with the coating outside. Plates of the reference sample are coated with a coating having a known emissivity factor. An electric heater is placed in the space between the plates and the plates are heated with constant power of the heater until steady-state temperature conditions are fully established. The emissivity factor of the analysed sample is determined using the formula: $$\epsilon =1-(P_m-P_0)/\left[S\cdot {\epsilon }_{Э}\cdot \sigma \cdot (T_S^4-T_C^4)\right],$$ where P_m, P₀ denote the power of the heat source used to heat the reference and analysed samples to a steady temperature value T_s, K; T_c is ambient temperature, K; σ is Stefan-Boltzmann constant; S is the heat dissipating area of the surface of the sample, m²; ε_e is the emissivity factor of the surface of the reference sample.

EFFECT: simple method and high measurement accuracy.

4 cl, 1 dwg