FIELD: thermal physics.
SUBSTANCE: invention relates to the field of thermal physics and relates to a method for determining the integral hemispherical emissivity of surfaces of solids and coatings. The method consists in heating a sample consisting of one plate with the surface under study from the side opposite to the surface under study to a predetermined temperature and holding until a steady state is established. The free thermocouple is placed horizontally and parallel to the investigated surface of the plate at a distance of 2-3 mm from the investigated surface. The temperature of the investigated surface Tn is determined, the reading of the free thermocouple Tm and the ambient temperature Tc are recorded. According to the data obtained, the integral hemispherical emissivity is calculated.
EFFECT: reducing the number of measurements, simplifying the processing of experimental data, increasing the accuracy and reliability of the results obtained and providing the possibility of carrying out measurements in a vacuum and a gaseous medium.
1 cl, 3 dwg
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Authors
Dates
2023-01-13—Published
2022-02-11—Filed