TWO-PHOTON SCANNING MICROSCOPE WITH AUTOMATIC PRECISION IMAGE FOCUSING AND METHOD FOR AUTOMATIC PRECISION IMAGE FOCUSING Russian patent published in 2014 - IPC G02B27/40 G02B21/00 

FIELD: physics, optics.

SUBSTANCE: microscope has a platform for placing a sample which is capable of moving at least vertically and horizontally, a laser radiation source for directing radiation incident on the analysed sample through a half-wave plate mounted on an automated rotating platform, a mirror system, a focusing device, a receiving part for automatic adjustment of the position of the analysed point on the surface of a sample at the focal point of the focusing device upon receiving radiation reflected from the analysed sample at second harmonic frequencies and two-photon luminescence. The focusing device is a lens system, or a light-beam expander and a gradient-index lens, or an objective lens, mounted on an automated micrometre translator, connected to a controller of the movement of the focusing device. The receiving part includes a detector used to receive reflected radiation through a polariser, a spectral filtration device and a short-focal length lens to the entrance aperture of optical fibre connected to the spectral filtration device.

EFFECT: providing automatic adjustment of the position of the analysed point on the surface of a sample in the focal point when receiving radiation reflected from the sample.

2 cl, 13 dwg