FIELD: test equipment.
SUBSTANCE: invention refers to thermophysical tests and can be applied in conductive material tests. Claimed setup for thermophysical tests of conductive material samples by pulse heating includes dilatometric system, process chamber with vacuum medium, thermocouples. Process chamber is equipped with current leads connected to sample, collet clamps for sample fixation. Dilatometric system is mounted directly on the test area of sample. Dilatometric system and thermocouples are connected to controls and instrumentation which in its turn is connected to PC. Dilatomertic system includes inductive coaxial position sensor. One current lead is connected to sample by flexible conductor, the other current lead is linked to it rigidly.
EFFECT: possible thermophysical tests of conductive materials with obtainment of comprehensive thermophysical parameters (thermal expansion, specific heat capacity, relative electric resistance) with pulse heating (at 100-1000 degrees/s rate) to ~800°C in vacuum along with personnel and environment protection from effects of tested conductive materials by sealing conductive material samples.
3 cl, 1 dwg
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Authors
Dates
2014-07-20—Published
2012-07-30—Filed