METHOD AND DEVICE FOR METERING THERMAL CHARACTERISTICS OF THIN-LAYER MATERIALS Russian patent published in 1999 - IPC

FIELD: power, mechanical, space engineering and other industries. SUBSTANCE: blackbody formed by two flat identical parallel specimens is preheated together with side and internal sectionalized screens to desired temperature by passing equal electric currents through specimens; these currents and voltage drop across central zone of each specimen, as well as temperature of outer surface of one specimen and that of inner surface of other specimen are measured, outer surface of one specimen is exposed to impulse heat at the same time recording temperature of opposite surface of same specimen; data obtained are used to calculate set of required thermal characteristics (thermal diffusivity and conductivity, specific heat, spectral and integral emissivity factor, resistivity). Device implementing this method is given in description of invention. EFFECT: reduced measurement error and increased temperature at which measurements may be made. 2 cl, 1 dwg, 1 tbl