METHOD OF PROFILING ASPHERICAL POLISHED SURFACE Russian patent published in 2015 - IPC G01B5/00 

FIELD: physics.

SUBSTANCE: profile of a polished aspherical surface of a large optical component is measured using a linear three-point spherometer with an additional lateral height-adjustable leg, which is nullified in a reference aspherical mirror; installing the spherometer with outermost legs perpendicular to the diametrical section in the peripheral area of the component; moving the spherometer with the outermost legs into an area in which the central leg with an indicator was previously located; continuing the process of taking readings of the indicator to the centre of the component or to the centre opening of the component and then, based on geometric ratios, constructing the absolute profile of deviations of the surface from a given (theoretical) profile with the required vertex radius and eccentricity and the necessary allowance.

EFFECT: constructing the absolute profile of deviations of the shape of an aspherical surface of an optical component from the required theoretical shape with the necessary accuracy and achieving the required value of the vertex radius during shaping.

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