METHOD TO MEASURE DEVIATIONS FROM PLANARITY Russian patent published in 2015 - IPC G01B11/30 

Abstract RU 2550317 C1

FIELD: measurement equipment.

SUBSTANCE: method to measure deviation from planarity includes installation of measurement device onto a working surface of a board, and the measurement device comprises a radiation instrument, such as a rotary laser level creating an auxiliary visible plane formed during rotation in the horizontal plane of the level laser beam, and a receiving device, such as a receiver of laser radiation with digital indication of deviation values, having previously tuned the receiving device on the reference horizontal board, moving it in the vertical direction to matching of zero mark on a photodetector with the auxiliary visible plane of the radiation device, and deviation of the working surface of the board from planarity is determined by the distance between the auxiliary visible plane and zero mark on the photodetector of the receiving device.

EFFECT: increased accuracy of measurement of surface deviations from planarity and simplification of the measurement method.

2 dwg

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RU 2 550 317 C1

Authors

Kachanov Viktor Veniaminovich

Ivanov Viktor Vladimirovich

Dates

2015-05-10Published

2014-01-09Filed