FIELD: physics.
SUBSTANCE: invention relates to an introscopic scanning system of an inspection system, having a linear electron accelerator which generates pulses with alternating low and high energy with a minimal interval t between two adjacent pulses, and a detector unit for collecting scanning data, which includes detector modules, analogue-to-digital converters and detection channels, each having two integrators for processing signals of one detector module. According to the invention, the time interval t1, during which photons of a detector module from one radiation pulse are collected, is not greater than the interval t between pulses, which is equal to or greater than the luminescence time of the material of scintillation crystals. Also disclosed is an introscopic scanning method carried out in said system.
EFFECT: invention enables to eliminate aliasing while maintaining a sufficiently high scanning rate.
12 cl, 3 dwg
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