METHOD OF DETERMINING SHAPE OF SCATTERING INDICATRIX OF DEFECT IN ULTRASOUND CONTROL AND DEVICE THEREFOR Russian patent published in 2016 - IPC G01N29/00 

FIELD: measurement technology.

SUBSTANCE: invention can be used for determining the shape of a defect scattering indicatrix during ultrasonic check. Matter point consists in the fact that there is recorded a spatial envelope of echo signals from the defect at points with known coordinates x of beam of the transducer exit point and there is calculated a normalized function of the envelope, which is connected with the shape of the scattering indicatrix, wile the spatial envelope is calculated by the time of arrival of echo signals in arbitrary points. At the time of arrival of an echo-signal with the maximum amplitude there is calculated the depth of the defect, while coordinates of other transducer beam exit points are calculated by the time of arrival of the signal in these points and by the calculated depth.

EFFECT: ensuring a possibility to develop a method for determination of a shape of the defect scattering indicatrix, allowing to automate the process, increase its reliability and accuracy of measurements, as well as reliability of the check.

2 cl, 2 dwg