FIELD: measuring equipment.
SUBSTANCE: invention relates to electrical measuring equipment and can be used for contactless remote control of operating state of supporting high-voltage insulators. Core: location of areas with high intensity of electric field and measurement of field intensity gradients are performed with an electrooptic sensor for control of electric field intensity by the value of coefficient of reflection of laser beam from the said sensor, which is proportional to the electric field intensity. Preliminarily the electrooptic sensor is graduated by its adding in calibrated variable electric field. Then for each type of insulators, which are subjected to the diagnostics, averaged values of intensity of variable electric fields are determined during bench measurements, that correspond to the working high voltage, together with limiting boundaries of gradients of intensity of electric fields, which do not create an electric breakdown or insulators overlap. Electrooptic sensor arranged on a dielectric bar and connected through a polarization discriminator and fiber light guide with a laser emitter, as well as with a photodetector, is scanned along the surface of the supporting high-voltage insulator. Herewith the spatial position of the electrooptical sensor on the surface of the insulator and relevant electric field intensity are recorded, and normal and tangential components of the electric field gradient are measured. Then spatial distribution of increased normal and tangential to the surface of electric field intensity gradients is compared with previously recorded distribution of intensity values for the reference insulator, and areas of possible internal breakdowns and surface overlaps in the insulator are detected by extraction of the electric field gradients exceeding the level safe for normal operation.
EFFECT: technical result is the possibility of determining the moment of occurrence of pre-defect state due to detection of areas with high intensity of electric field and measurement of electric field gradients in these areas with subsequent detection of defects.
1 cl, 2 dwg
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Authors
Dates
2016-09-20—Published
2015-07-29—Filed