METHOD OF MEASUREMENT OF TEMPERATURE OF LOCAL AREAS OF SURFACE OF THE MELT IN MELTING POT WHEN GROWING MONOCRYSTALS OF SUBSTANCES WITH MELTING POINTS ABOVE 650 °C BY THE CHOKHRALSKIY METHOD Russian patent published in 2018 - IPC C30B15/20 G01J5/50 

FIELD: measuring equipment.

SUBSTANCE: invention relates to the field of temperature measurements and relates to a method for measuring the temperature of local sections of the melt surface in a melting pot when growing monocrystals of substances with melting points above 650 °C by the Chokhralskiy method. Method includes photographing of a visible melt surface with a crystal with a digital color apparatus through the inspection window of the growth chamber, transfer of the image file to the computer, calculation of temperature for the brightness of the pixels of the three color RGB channels based on the Stefan-Boltzmann law for the density of black body radiation, setting of the known melting point of the grown crystal in the program window, calibration of the program, pointing with the cursor on the point of interest or on an area with selected small dimensions of 3 × 3, 5 × 5 or 7 × 7 pixels, within which the temperature is averaged, reading of the temperature value in the user interface window. Calibration of the program involves pointing the cursor on the point in the image of the line of contact between the crystal and the melt, the temperature in which is taken as the melting point.

EFFECT: technical result consists in increasing the accuracy of measurements and improving the structural quality of the crystals.

1 cl, 4 dwg