METHOD OF MEASUREMENT OF SHF QUADRIPOLES S-PARAMETERS INTENDED FOR INCLUSION INTO MICRO-STRIP LINE Russian patent published in 2018 - IPC G01R27/28 

Abstract RU 2653569 C1

FIELD: measuring equipment.

SUBSTANCE: invention relates to SHF radio measurement equipment and can be used for measurement of the S-parameters of the quadripoles. Method of SHF quadripoles S-parameters measuring intended for inclusion into the microstrip line is that the quadripole is included into the analyzer, further the two-signal complex reflection coefficients at the input and output are measured with two different relative shifts of the input and output probing signals. Also, two-signal complex reflection coefficients are measured with direct butt-end connection of the analyzer's input and output measuring channels inputs and the subsequent determination of the quadripole S-parameters. In order to achieve the technical result, single-signal complex reflection coefficients at the input and output of the quadripole are additionally measured by alternately feeding the input and output probing signals to them, respectively, as well as single-signal complex reflection coefficients of the input and output measuring channels of the analyzer with direct butt connection of their measuring inputs with alternate application to them of the output and input sounding signals, respectively. At that, a dual matched microstrip calibrator is connected to the analyzer and its complex reflection coefficients are additionally measured by alternately feeding the input and output probing signals to it, with subsequent normalization of the quadripole S-parameters, measured in the coaxial measuring channels of the analyzer relative to the wave resistance of this calibrator.

EFFECT: increasing the accuracy of measuring the quadripoles S-parameters in the mismatched measuring channels of the analyzer, as well as reducing labor costs with multiple technological correction of the prototype of these devices.

1 cl, 2 dwg

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RU 2 653 569 C1

Authors

Savelkaev Sergej Viktorovich

Romasko Svetlana Vladimirovna

Dates

2018-05-11Published

2017-03-29Filed