METHOD OF IMITATION OF GAP DEFECT IN MULTILAYER STRUCTURES Russian patent published in 2018 - IPC G01N29/30 

Abstract RU 2667317 C1

FIELD: defectoscopy.

SUBSTANCE: using: for testing multi-layer composite material products. Essence of invention consists inimitation of gap defect in multilayer structures consisting of honeycomb core and sheathing, perform an underestimation of the adjacent face or facets of honeycomb cells with the creation of a closed contour, the perimeter of which is formed by the facets of whole cells, and gluing it with the sheathing by means of an adhesive film, previously removing it along the perimeter formed by the faces of whole cells. Cells can have a triangular, square, hexagonal shape, honeycomb filler and sheathing made of metal, fiberglass, carbon fiber, and the design can consist of three, five or seven layers.

EFFECT: ensuring the possibility of a significant increase in the accuracy of imitation of a gap defect of a given area that is closest to natural defects.

4 cl, 2 dwg

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RU 2 667 317 C1

Authors

Rusakov Dmitrij Yurevich

Chernushin Vyacheslav Aleksandrovich

Dates

2018-09-18Published

2017-09-18Filed