FIELD: measuring equipment.
SUBSTANCE: invention relates to methods of determining the concentration of impurities. Luminescent method of determining the concentration of the luminescent centers in crystalline materials includes the excitation of luminescent impurities by an electron beam, its duration is 0.1 of the radiative lifetime of the shortest-lived glow center, registration of luminescence, identification of characteristic bands in the luminescence spectrum, identification of luminescent centers, measurement of intensities of the standard and characteristic bands, determination of concentration with the use of data on calibration samples, where the internal standard of sensitivity is self fundamental broadband luminescence of the material being studied, its duration is shorter than the radiative time of the luminescent centers. To excite the luminescence of impurities and the reference broadband luminescence of the sample, laser femtosecond pulses are used with intensity, that provides the excitation of a crystalline substance. Perpendicular to the laser excitation beam is the input slit diaphragm of the luminescence registration system, a coordinate-moving sample, has a size equal to the spatial extent of the femtosecond laser pulse.
EFFECT: technical result consists in increasing the volume and spatial accuracy of non-destructive control of the impurity concentration distribution in crystalline materials with a reduction in the complexity of the design of the movement of the sample and the cost of working time for the preparation of equipment.
1 cl, 7 dwg, 1 tbl
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Authors
Dates
2018-09-24—Published
2017-07-13—Filed