FIELD: measurement technology.
SUBSTANCE: use to determine the thickness of films of polymer composites. Essence of the invention lies in the fact that the method for estimating the thickness of thin polymer films is carried out by analyzing the dielectric characteristics of the samples and their dependences on the thickness using a linear dependence of the temperature of the conductivity change on the thickness of the FDP films (the temperature at which the dielectric conductivity varies with the thickness of the polymer film).
EFFECT: providing the possibility of estimating the thickness of polymer films by the temperature of the transition of the polymer composite to a conducting state.
1 cl, 3 dwg
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