FIELD: calculating; counting.
SUBSTANCE: invention relates to the computer equipment. Method of comparing data in the cell of the AMD includes the discharge of the potential of the coincidence line to a low logic level during the cycle of comparison of the data stored in the memory cell with the external data when the data stored in the memory cell does not match with the external data, moreover, the specified discharge of the potential of the coincidence line is carried out by the flow of current between one of the two paraphase outputs of the data comparison amplifier and the coincidence line pre-charged to a high logic level after the establishment of one of the paraphase data comparison signals to a low logic level at the source of one of two transistors of the same conductivity type, parallelly installed between the line of coincidence and paraphase data comparison buses and when a specified high level logic transistor is applied to the gate from one of the two storage nodes of the memory cell.
EFFECT: technical result is to reduce the area of the associative memory device (AMD) and increase its noise immunity.
3 cl, 5 dwg
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| 0 |
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SU408374A1 |
Authors
Dates
2019-02-28—Published
2018-01-23—Filed