TEST BENCH FOR MEASURING PARAMETERS OF THERMAL IMAGING CHANNELS Russian patent published in 2019 - IPC G01M11/02 H04N5/33 G01J5/10 

FIELD: instrument engineering.

SUBSTANCE: invention relates to optoelectronic instrument making and is intended for automated measurement of parameters of thermal imaging channels (TIC) during manufacturing. Into a test bench for measuring parameters of thermal imaging channels, comprising an infrared collimator complex (ICC) located coaxially with an optical system of a controlled thermal imaging channel (TIC), information display, recording and processing device (IDRPD), comprising a personal computer (PC) and a video signal format converter, as well as an exchange rate converter and a working voltage generator, wherein the first port of the ICC is connected to the first port of the PC, first and second ports of the video signal format converter are connected to the first TIC port and the second PC port respectively, the first and second ports of the exchange standards converter are connected to the second TIC port and the third PC port respectively, first and second ports of working voltage driver are connected to third port of TIC and to fourth port of PC respectively, according to present invention, additionally introduced is device for simulation of ambient temperature for placement of TIC and generator of control commands for temperature modes, wherein the first and second ports of the temperature control command generator are connected to the first port of the ambient temperature simulation device and the fifth PC port, respectively.

EFFECT: proposed technical solution allows to expand functional capabilities of the stand due to automatic and individual (for each TIC) determination during adjustment of required movement of the movable component of the optical TIC system to provide focusing when ambient temperature changes.

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