TEST BENCH FOR MEASURING PARAMETERS OF THERMAL IMAGING CHANNELS Russian patent published in 2019 - IPC G01M11/02 H04N5/33 G01J5/10 

FIELD: instrument engineering.

SUBSTANCE: invention relates to optoelectronic instrument making and is intended for automated measurement of thermal imaging channel parameters (TPVC). In the test bench for measuring parameters of thermal imaging channels, comprising a series-mounted infrared collimating complex (ICC) and a controlled thermal imaging channel (TPVC), as well as a device for controlling, displaying, recording and processing information (CDRPI), comprising a personal computer (PC), first port of which is connected to first port of ICC, video signals formats converter (VFC), first port of which is connected to first TPVC port, and second port is connected to second port of PC, an exchange standards converter (ESC), first and second ports of which are connected to a second TPVC port and a third PC port respectively, work voltage shaper (WVS), the first port of which is connected to the third TPVC port, according to the present invention, additionally introduced is a rotary-inclined device (RID) for TPVC arrangement, equipped with an actuating mechanism (AM), wherein the CDRPI additionally comprises a rotary-inclined (SC-RID) device signal converter, the first and second ports of which are connected to the first and second ports of the AM, and the third and fourth ports of the SC-RID are connected to the fourth and fifth ports of the PC, respectively, wherein the second port of the WVS is connected to the third AM port. Technical result is achieved due to the fact that the sixth port of the PC is connected to the third port of the WVS to control the operation mode of the WVS.

EFFECT: broader functional capabilities of the test bench owing to the possibility of automated measurement of TPVC parameters, where it is necessary to change and measure the angle of rotation and inclination of the TPVC optical axis relative to the optical axis of the ICC.

1 cl, 1 dwg