FIELD: physics.
SUBSTANCE: invention relates to ionosphere studies and can be used to determine parameters of ionospheric layers. Summary: ionograms-pattern adjustment, determined by required parameters, is performed for experimentally obtained ionogram by searching for maximum overlapping of said two ionograms. Template used is an ionogram obtained by solving a direct problem of propagation of radio waves in an ionospheric plasma. Maximum overlap is found using the Nelder-Mead optimization algorithm. Note here that pattern adjustment may be performed step-by-step for different parts of ionogram and ionospheric layers. Experimentally obtained ionogram is pre-modified to facilitate search in order to eliminate sharp edges of trace, and area of parameters is divided into parts, in each of which adjustment is performed in parallel in order to find global maximum.
EFFECT: operational monitoring of ionosphere parameters round-the-clock without operator intervention.
1 cl, 2 dwg
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