METHOD OF DETERMINING ORIGIN OF MICRO-FRAGMENTS OF KIMBERLITES Russian patent published in 2020 - IPC G01N23/2251 G01V9/00 

FIELD: geology.

SUBSTANCE: invention relates to geology and can be used to determine origin of micro-fragments of kimberlites. Samples for research are pre-processed, marked and photographed. Samples are irradiated with an electron beam at the stage of determining the chemical structure of the surface and at the stage of determining the chemical composition of the minerals. Irradiation of the samples at the stage of determining the chemical structure of the surface is carried out by detecting reflected electrons and representing the surface of the sample in the form of a contrast map on the average atomic number. At the stage of determining the chemical composition of the minerals, the samples are irradiated by detecting the characteristic X-ray radiation of the substance which occurs when the sample is irradiated with electrons. Obtained data are compared with reference values entered in pre-formed database. Detecting coincidence of obtained data with reference values, determining micro-fragments of kimberlites belonging to known deposits.

EFFECT: high accuracy and objectivity of determining origin of micro-fragments of kimberlites.

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