METHOD FOR INDIRECT MEASUREMENT OF FAIL-SAFETY OF IRRADIATED TEST DIGITAL MICROCIRCUITS, WHICH ARE BUILT USING DIFFERENT METHODS OF PERMANENT ELEMENT-BY-ELEMENT REDUNDANCY, AND FUNCTIONAL STRUCTURE OF TEST MICROCHIP INTENDED FOR IMPLEMENTATION OF THIS METHOD Russian patent published in 2020 - IPC G06F11/07 

Abstract RU 2724804 C1

FIELD: electrical engineering.

SUBSTANCE: invention relates to methods for indirect measurement of fail-safety of irradiated digital test microchips, which are built using various methods of permanent element-by-element redundancy, and to test microcircuits for implementation of these measurement methods. Theoretical methods are used to calculate fault tolerance of microcircuits based on estimation of probability of failure of irradiated microcircuits "by area". Average operating time of the microchip is used until its failure from the moment of irradiation taken as the initial one until the moment of fixation of the number of successive failures of the irradiated microcircuit in a given number of adjacent cycles of operation of test microchips.

EFFECT: design of facilities for testing methods of constructing digital microcircuits based on continuous elementwise redundancy in order to obtain experimental estimates of their fault tolerance to radiation.

6 cl, 2 dwg

Similar patents RU2724804C1

Title Year Author Number
METHOD FOR INDIRECT MEASUREMENT OF FAULT TOLERANCE OF IRRADIATED TEST DIGITAL MICROCIRCUITS, BUILT BY METHOD FOR CONSTANT REDUNDANCY, AND FUNCTIONAL STRUCTURE OF TEST MICROCIRCUIT INTENDED FOR IMPLEMENTATION OF THIS METHOD 2020
  • Aleksandrov Petr Anatolevich
  • Zhuk Viktor Ilich
RU2756577C1
METHOD OF HOT PARALLEL ELEMENT-BY-ELEMENT DUPLICATION IN DIGITAL TRANSISTOR CHIPS 2017
  • Aleksandrov Petr Anatolevich
  • Zhuk Viktor Ilich
  • Litvinov Valerij Lazarevich
RU2677359C1
METHOD FOR CONSTANT ELEMENT-BY-ELEMENT BACKUP IN DISCRETE ELECTRONIC SYSTEMS (VERSIONS) 2011
  • Aleksandrov Petr Anatol'Evich
  • Zhuk Viktor Il'Ich
  • Litvinov Valerij Lazarevich
RU2475820C1
METHOD TO FORM FAULT-TOLERANT COMPUTING SYSTEM AND FAULT-TOLERANT COMPUTING SYSTEM 2010
  • Syrov Anatolij Sergeevich
  • Andreev Viktor Petrovich
  • Smirnov Viktor Vladimirovich
  • Astretsov Vladimir Aleksandrovich
  • Kosobokov Viktor Nikolaevich
  • Sinel'Nikov Vladimir Vasil'Evich
  • Karavaj Mikhail Fedorovich
  • Dorskij Rostislav Jur'Evich
  • Zimin Dmitrij Jur'Evich
  • Kalugina Irina Jur'Evna
RU2439674C1
FAULT-TOLERANT BOARD MICROPROCESSOR SYSTEM, ALARM TIMER SERVICE, METHOD FOR OPERATIONS OF FAULT-TOLERANT MICROPROCESSOR SYSTEM 1998
  • Borisov Ju.I.
  • Groshev A.S.
  • Laponin V.V.
  • Mirzojan I.Eh.
  • Nikitin B.D.
  • Stupachenko V.F.
  • Judin B.N.
  • Jafrakov M.F.
RU2131619C1
METHOD AND COMPUTING SYSTEM FOR FAULT-TOLERANT PROCESSING OF INFORMATION OF AIRCRAFT CRITICAL FUNCTIONS 2008
  • Avakjan Aleksandr Anushanovich
  • Suchkov Vitalij Nikolaevich
  • Iskandarov Rustambek Dzhurabekovich
  • Shurman Vladimir Aleksandrovich
  • Kopnenkova Marina Vladimirovna
  • Vovchuk Natal'Ja Georgievna
RU2413975C2
METHOD FOR FAULT-TOLERANT FUNCTIONING OF COMPUTER SYSTEMS FOR INFORMATION PROCESSING SYSTEMS FOR MILITARY PURPOSES AND A DEVICE THAT IMPLEMENTS IT 2022
  • Kardash Sergej Mikhajlovich
  • Demidov Aleksandr Vladimirovich
  • Lyaskovskij Viktor Lyudvigovich
  • Shlepkov Aleksej Anatolevich
RU2775259C1
METHOD CREATING FOUR-CHANNEL FAIL-SAFE SYSTEM FOR ON-BOARD HIGH-FAULT TOLERANCE AND ENERGY EFFICIENT CONTROL COMPLEX AND USE THEREOF IN SPACE APPLICATIONS 2011
  • Syrov Anatolij Sergeevich
  • Andreev Viktor Petrovich
  • Smirnov Viktor Vladimirovich
  • Romadin Jurij Alekseevich
  • Petrov Andrej Borisovich
  • Sinel'Nikov Vladimir Vasil'Evich
  • Dorskij Rostislav Jur'Evich
  • Karavaj Mikhail Fedorovich
  • Kosobokov Viktor Nikolaevich
  • Astretsov Vladimir Aleksandrovich
  • Janovskij Andrej Jur'Evich
  • Zimin Dmitrij Jur'Evich
  • Kalugina Irina Jur'Evna
  • Sokolov Vladimir Nikolaevich
  • Lunjakov Sergej Vasil'Evich
  • Dobrynin Dmitrij Alekseevich
RU2449352C1
METHOD FOR DEMODULATION OF DIGITAL SIGNALS AND DEVICE FOR ITS REALIZATION 1991
  • Klovskij D.D.
  • Kartashevskij V.G.
  • Belous S.A.
RU2102836C1
TEST SEQUENCE GENERATOR 0
  • Kadanskij Aleksandr Abramovich
  • Korolev Vladimir Nikolaevich
  • Rukkas Oleg Dmitrievich
  • Sidorenko Vasilij Petrovich
SU1543396A1

RU 2 724 804 C1

Authors

Aleksandrov Petr Anatolevich

Zhuk Viktor Ilich

Dates

2020-06-25Published

2019-11-27Filed