FIELD: measuring equipment.
SUBSTANCE: invention relates to systems and methods of detecting changes on the surface of structural elements or inside them based on scattered X-rays. Method comprises making a control sample of material from which said structure is made, creating and storing calibration data determined based on control sample, radiating the structure with X-rays, detecting scattered X-rays scattered on the structure, and determining said one property of structure or more based on detected scattered X-rays and calibration data.
EFFECT: technical result is high accuracy of detecting changes in structural elements.
19 cl, 6 dwg
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