SHEAR SPECKLE INTERFEROMETER (VERSIONS) Russian patent published in 2020 - IPC G01B9/02 

FIELD: optoelectronic measurements.

SUBSTANCE: invention relates to the field of optical-electronic measurements, namely to shear speckle interferometry, and can be used for detection and measurement of parameters of defects of different diffuse-reflecting objects. Disclosed shear speckle interferometer includes a detection chamber, a laser radiation source and a focusing element in the form of a binary lens with a diaphragm. Diaphragm is made in the form of an opaque screen with four off-center holes, which are mirror-like relative to two perpendicular axes of symmetry, which intersect in the center of the screen on the optical axis of the interferometer. Binary lens can be formed by four identical sectors of initial circular lens spaced from each other to form uniform gaps parallel to said axes of symmetry. In another version, binary lens is formed by aligning four identical sectors remaining after removal of initial round lens diametral areas parallel to said axes of symmetry.

EFFECT: high accuracy of measurements.

6 cl, 1 tbl, 6 dwg