FIELD: scanning probe microscopy.
SUBSTANCE: invention relates to the field of scanning probe microscopy and can be used in studying the microrelief of reflecting surfaces, for example, in crystallography, metrology, when studying high-molecular compounds, as well as for local studies of microobjects in the form of nanostructured materials and biological objects. Probe of near-field optical microscope is made in form of optically transparent sharpened element 1, which is an optically transparent sharpened capillary element 1 with tip 4, in the area of which there is optical matching device 6, conjugated with optically transparent sharpened capillary element 1. On the outer side of the optically transparent sharpened element 1 there is conductive layer 5, and in the point of tip 4 there is an optical matching device 6.
EFFECT: technical result consists in improvement of reliability of a near-field optical microscope.
7 cl, 9 dwg
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