FIELD: measurement technology; magnetic force microscopy.
SUBSTANCE: invention can be used to study and diagnose the magnetic properties of various structures, for example, devices for ultra-dense magnetic recording of information, spintronics, high-coercive permanent magnets, as well as to analyse the distribution of magnetic impurities in material. The essence of the invention is that the probe for magnetic force microscopy is made in the form of pointed capillary element 2, having cylindrical part 4 and cone-shaped part 5 with tip 1, inside of which there are magnetic nanoparticles with core-shell structure 3.
EFFECT: increasing the reliability of the probe sensor.
8 cl, 7 dwg
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