FIELD: measuring technology.
SUBSTANCE: inventions relate to measuring technology for measuring temperature at various depths of electrically conductive media. The proposed method for measuring the spatial distribution of temperature and a device for its implementation can be used in the production of materials and alloys, in metallurgy, in high-temperature combustion chambers, in the production of temperature sensors, to control the temperature of electrically conductive solids and liquids. A method for measuring the spatial distribution of temperature is claimed, according to which a frequency-modulated electric current with a frequency band of wmin≤w≤wmax (Ohm) is supplied to the investigated electrically conductive object through the surface electrodes, thereby forming a skin layer of variable thickness d, penetrating to a depth of dmin≤d≤dmax of the object under study. Then in the frequency band wmin≤w≤wmax the frequency characteristic of the impedance Z(jw) is measured, which is used to determine the distribution of electrical conductivity over the depth s(d). The distribution s(d) found and the previously experimentally found or theoretically known dependences of the electrical conductivity of the material of the object of study on temperature s=f(T) are used to judge the spatial distribution of temperature over the depth T(d) in the object under study. Also proposed is a device for implementing the proposed method, in which the signal generator is a signal generator with a frequency band wmin≤w≤wmax, the processing unit is a calculator of the frequency response of the impedance Z(jw). The output of the signal generator is the output for connection with the electrically conductive test object using the first electrode, and the second input of the calculator of the frequency response of the impedance Z(jw) is the input for connection with the electrically conductive test object through the second electrode. The output of the calculator of the frequency characteristic of the impedance Z(jw) is connected to the input of the calculator of the distribution of electrical conductivity s(d) and the spatial distribution of temperature T(d).
EFFECT: invention ensures the possibility of measuring the temperature distribution along the depth of the electrically conductive object of study.
2 cl, 4 dwg
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Authors
Dates
2021-07-13—Published
2020-12-18—Filed