APPARATUS FOR MEASURING INTRINSIC QUALITY FACTOR OF DIELECTRIC RESONATOR Russian patent published in 2021 - IPC G01R27/26 

Abstract RU 2753662 C1

FIELD: electrical engineering.

SUBSTANCE: invention relates to ultra high frequency equipment and is intended for measuring selective properties of high-quality miniature open dielectric resonators. The apparatus comprises a waveguide section 1 with a rectangular cross-section, electromagnetically connected with a volumetric metal resonator 2 via a connecting element 3, and an open dielectric resonator 4 with the lowest H-type oscillation with a resonant frequency equal to the resonant frequency of the volumetric metal resonator 2, placed in the volumetric metal resonator. The volumetric metal resonator 2 is made in form of a parallelepiped with a rectangular cross-section identical to the cross-section of the waveguide section 1 and with a length L equal to the wavelength λ in the waveguide at the resonant frequency of the volumetric metal resonator 2. The volumetric metal resonator 2 is installed longitudinally at the end of the waveguide section 1 with a rectangular cross-section and is separated therefrom by a metal wall 5 attached at the end, configured to rotate around the longitudinal axis of the waveguide section 1 with a rectangular cross-section, with the connecting element 3 in form of a hole in the wall 5 in form of a slot parallel to the wide wall 6 of the resonator 2. The resonator 4 is placed in the centre of the cross-section and the longitudinal dimension of the volumetric metal resonator 2. The wide wall 7 of the open dielectric resonator 4 is perpendicular to the plane of the wide wall 6 of the resonator 2. The open dielectric resonator 4 is fixed on a dielectric rod 8 the axis whereof is parallel to the plane of the wide wall 8 of the open dielectric resonator 4 and wherein said rod is installed in the hole 9 in the wide wall 6 of the volumetric metal resonator 2, configured for said resonator to rotate around the axis of the dielectric rod 8.

EFFECT: simplification of the process of adjustment of measuring equipment with increased accuracy of measuring the intrinsic quality factor of an open dielectric resonator.

1 cl, 3 dwg

Similar patents RU2753662C1

Title Year Author Number
DEVICE FOR MEASURING THE INHERENT QUALITY OF A DIELECTRIC RESONATOR 2020
  • Gevorkyan Vladimir Mushegovich
  • Kazantsev Yurij Alekseevich
  • Shutov Aleksandr Vadimovich
RU2745591C1
METHOD FOR MEASURING INTRINSIC Q-FACTOR OF DIELECTRIC RESONATOR 2020
  • Gevorkyan Vladimir Mushegovich
  • Kazantsev Yurij Alekseevich
  • Shutov Aleksandr Vadimovich
RU2739937C1
BANDPASS FILTER 2009
  • Bunin Anatolij Veniaminovich
  • Gevorkjan Vladimir Mushegovich
  • Perevezentsev Sergej Aleksandrovich
RU2397579C1
MICROWAVE OSCILLATOR 0
  • Mirnyj Sergej Vasilevich
  • Pochernyaev Vitalij Nikolaevich
  • Skrypnik Leonid Vasilevich
SU1775838A1
METHOD TO MEASURE LEVEL OF SUBSTANCE IN TANK 2014
  • Sovlukov Aleksandr Sergeevich
RU2558630C1
S H F FILTER 1991
  • Jushchenko Aleksandr Georgievich[Ua]
  • Popov Vladimir Valentinovich[Ua]
  • Shibalkin Sergej Fedorovich[Ua]
  • Jurchenko Jurij Petrovich[Ua]
RU2046467C1
SHF METHOD OF MEASUREMENT OF MOISTURE CONTENT AND SENSITIVE ELEMENT IN THE FORM OF OPEN WAVEGUIDE RESONATOR FOR ITS IMPLEMENTATION 1992
  • Kondrat'Ev E.F.
RU2096768C1
MICROWAVE DEVICE FOR NONDESTRUCTIVE MEASUREMENTS OF ELECTROPHYSICAL PARAMETERS OF INSULATING MATERIALS 2001
  • Duving V.G.
RU2188433C1
MICROWAVE MULTIPLEXER 2017
  • Meshchanov Valerij Petrovich
  • Tsarev Vladislav Alekseevich
  • Shalaev Pavel Danilovich
  • Kats Boris Markovich
RU2645033C1
SHF FILTER 0
  • Stakhurskij Leonid Leonidovich
SU1732403A1

RU 2 753 662 C1

Authors

Gevorkyan Vladimir Mushegovich

Vishnyakov Sergej Viktorovich

Kazantsev Yurij Alekseevich

Shutov Aleksandr Vadimovich

Mikhalin Sergej Nikolaevich

Dates

2021-08-19Published

2020-09-08Filed