METHOD OF MEASURING INTRINSIC QUALITY FACTOR OF DIELECTRIC RESONATOR Russian patent published in 2024 - IPC G01R27/06 

FIELD: microwave equipment.

SUBSTANCE: invention relates to microwave engineering and is intended for measuring properties of high-quality miniature open dielectric resonators. Effective intrinsic quality factor Q_e' DR in the matched waveguide is measured, using diaphragms with coupling holes at the ends of the section of a hollow rectangular waveguide, which includes the area of the DR location, a volumetric metal resonator (MR) is formed, and its resonance frequency ω₀ and intrinsic quality factor Q_MR is measured. Surface resistance R_S of the walls of the waveguide and diaphragms made from the same material and at the ends of the section of the hollow rectangular waveguide are calculated. Relative permittivity of quartz rod intended for attachment of DR and DR material is determined. Effective intrinsic quality factor of the DR in the waveguide Q_e'' is determined based on the numerical simulation of the structure of a hollow section of a rectangular waveguide with DR made of material with permittivity ε and measurement uncertainty value tan δ=0 at surface resistance R_S. Effective intrinsic quality factor of the DR in the waveguide without losses Q_e''' is determined from the reflection coefficients S₁₁ or transmission S_21. Intrinsic quality factor Q₀ DR is determined from the relationship

EFFECT: reliability and simplicity of measurement of intrinsic quality factor of high-quality (with quality factor higher than 10⁴) open dielectric resonator.

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