FIELD: flaw detection.
SUBSTANCE: invention relates to the field of flaw detection. A device for magneto-optical visualization of defects in electrically conductive materials and their automatic fixation, including an eddy current inductor and an imaging device containing a magneto-optical (MO) element made of a garnet-ferrite epitaxial film and a mirror-protective coating, a CCD camera, the optical axis of which is directed to the magneto-optical element through the analyzer, while it contains a pulsed white light source, the optical axis of which coincides with the axis of the polarizer, connected through a series-connected power supply, a switch, a pulse generator with an amplifier and an eddy current inductor, and a lens system, the optical axis of which coincides with the axis of the analyzer and the CCD camera, an automatic defect fixing device connected via a power supply to a switch, a recording device, a pulsed white light source, a CCD camera, a data storage device, an LCD display and a PC connector.
EFFECT: automation of the scanning process of the object under study, increasing the scanning speed with subsequent processing by the operator of only marked problem areas.
1 cl, 2 dwg
